Picture for Hendrik P. A. Lensch

Hendrik P. A. Lensch

EMPERROR: A Flexible Generative Perception Error Model for Probing Self-Driving Planners

Add code
Nov 12, 2024
Figure 1 for EMPERROR: A Flexible Generative Perception Error Model for Probing Self-Driving Planners
Figure 2 for EMPERROR: A Flexible Generative Perception Error Model for Probing Self-Driving Planners
Figure 3 for EMPERROR: A Flexible Generative Perception Error Model for Probing Self-Driving Planners
Figure 4 for EMPERROR: A Flexible Generative Perception Error Model for Probing Self-Driving Planners
Viaarxiv icon

Is deeper always better? Replacing linear mappings with deep learning networks in the Discriminative Lexicon Model

Add code
Oct 05, 2024
Viaarxiv icon

RISE-SDF: a Relightable Information-Shared Signed Distance Field for Glossy Object Inverse Rendering

Add code
Sep 30, 2024
Figure 1 for RISE-SDF: a Relightable Information-Shared Signed Distance Field for Glossy Object Inverse Rendering
Figure 2 for RISE-SDF: a Relightable Information-Shared Signed Distance Field for Glossy Object Inverse Rendering
Figure 3 for RISE-SDF: a Relightable Information-Shared Signed Distance Field for Glossy Object Inverse Rendering
Figure 4 for RISE-SDF: a Relightable Information-Shared Signed Distance Field for Glossy Object Inverse Rendering
Viaarxiv icon

Subsurface Scattering for 3D Gaussian Splatting

Add code
Aug 22, 2024
Figure 1 for Subsurface Scattering for 3D Gaussian Splatting
Figure 2 for Subsurface Scattering for 3D Gaussian Splatting
Figure 3 for Subsurface Scattering for 3D Gaussian Splatting
Figure 4 for Subsurface Scattering for 3D Gaussian Splatting
Viaarxiv icon

DualAD: Disentangling the Dynamic and Static World for End-to-End Driving

Add code
Jun 10, 2024
Viaarxiv icon

Iterative Cluster Harvesting for Wafer Map Defect Patterns

Add code
Apr 23, 2024
Figure 1 for Iterative Cluster Harvesting for Wafer Map Defect Patterns
Figure 2 for Iterative Cluster Harvesting for Wafer Map Defect Patterns
Figure 3 for Iterative Cluster Harvesting for Wafer Map Defect Patterns
Figure 4 for Iterative Cluster Harvesting for Wafer Map Defect Patterns
Viaarxiv icon

Disentangling representations of retinal images with generative models

Add code
Feb 29, 2024
Figure 1 for Disentangling representations of retinal images with generative models
Figure 2 for Disentangling representations of retinal images with generative models
Figure 3 for Disentangling representations of retinal images with generative models
Figure 4 for Disentangling representations of retinal images with generative models
Viaarxiv icon

SHINOBI: Shape and Illumination using Neural Object Decomposition via BRDF Optimization In-the-wild

Add code
Jan 18, 2024
Viaarxiv icon

Zero-shot Translation of Attention Patterns in VQA Models to Natural Language

Add code
Nov 08, 2023
Viaarxiv icon

ViPE: Visualise Pretty-much Everything

Add code
Oct 16, 2023
Viaarxiv icon