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Simon Baeuerle

Coverage Path Planning for Thermal Interface Materials

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May 22, 2024
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Iterative Cluster Harvesting for Wafer Map Defect Patterns

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Apr 23, 2024
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MLOps for Scarce Image Data: A Use Case in Microscopic Image Analysis

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Oct 04, 2023
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Rapid Flow Behavior Modeling of Thermal Interface Materials Using Deep Neural Networks

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Aug 09, 2022
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CAD2Real: Deep learning with domain randomization of CAD data for 3D pose estimation of electronic control unit housings

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Sep 25, 2020
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