A Novel Representation of Periodic Pattern and Its Application to Untrained Anomaly Detection

There are a variety of industrial products that possess periodic textures or surfaces, such as carbon fiber textiles and display panels. Traditional image-based quality inspection methods for these products require identifying the periodic patterns from normal images (without anomaly and noise) and subsequently detecting anomaly pixels with inconsistent appearances. However, it remains challenging to accurately extract the periodic pattern from a single image in the presence of unknown anomalies and measurement noise. To deal with this challenge, this paper proposes a novel self-representation of the periodic image defined on a set of continuous parameters. In this way, periodic pattern learning can be embedded into a joint optimization framework, which is named periodic-sparse decomposition, with simultaneously modeling the sparse anomalies and Gaussian noise. Finally, for the real-world industrial images that may not strictly satisfy the periodic assumption, we propose a novel pixel-level anomaly scoring strategy to enhance the performance of anomaly detection. Both simulated and real-world case studies demonstrate the effectiveness of the proposed methodology for periodic pattern learning and anomaly detection.

F2PAD: A General Optimization Framework for Feature-Level to Pixel-Level Anomaly Detection

Image-based inspection systems have been widely deployed in manufacturing production lines. Due to the scarcity of defective samples, unsupervised anomaly detection that only leverages normal samples during training to detect various defects is popular. Existing feature-based methods, utilizing deep features from pretrained neural networks, show their impressive performance in anomaly localization and the low demand for the sample size for training. However, the detected anomalous regions of these methods always exhibit inaccurate boundaries, which impedes the downstream tasks. This deficiency is caused: (i) The decreased resolution of high-level features compared with the original image, and (ii) The mixture of adjacent normal and anomalous pixels during feature extraction. To address them, we propose a novel unified optimization framework (F2PAD) that leverages the Feature-level information to guide the optimization process for Pixel-level Anomaly Detection in the inference stage. The proposed framework is universal and plug-and-play, which can enhance various feature-based methods with limited assumptions. Case studies are provided to demonstrate the effectiveness of our strategy, particularly when applied to three popular backbone methods: PaDiM, CFLOW-AD, and PatchCore.

3D-CSAD: Untrained 3D Anomaly Detection for Complex Manufacturing Surfaces

The surface quality inspection of manufacturing parts based on 3D point cloud data has attracted increasing attention in recent years. The reason is that the 3D point cloud can capture the entire surface of manufacturing parts, unlike the previous practices that focus on some key product characteristics. However, achieving accurate 3D anomaly detection is challenging, due to the complex surfaces of manufacturing parts and the difficulty of collecting sufficient anomaly samples. To address these challenges, we propose a novel untrained anomaly detection method based on 3D point cloud data for complex manufacturing parts, which can achieve accurate anomaly detection in a single sample without training data. In the proposed framework, we transform an input sample into two sets of profiles along different directions. Based on one set of the profiles, a novel segmentation module is devised to segment the complex surface into multiple basic and simple components. In each component, another set of profiles, which have the nature of similar shapes, can be modeled as a low-rank matrix. Thus, accurate 3D anomaly detection can be achieved by using Robust Principal Component Analysis (RPCA) on these low-rank matrices. Extensive numerical experiments on different types of parts show that our method achieves promising results compared with the benchmark methods.

MPOFI: Multichannel Partially Observed Functional Modeling for Defect Classification with Imbalanced Dataset via Deep Metric Learning

In modern manufacturing, most of the product lines are conforming. Few products are nonconforming but with different defect types. The identification of defect types can help further root cause diagnosis of production lines. With the sensing development, continuous signals of process variables can be collected in high resolution, which can be regarded as multichannel functional data. They have abundant information to characterize the process and help identify the defect types. Motivated by a real example from the pipe tightening process, we target at detect classification when each sample is a multichannel functional data. However, the available samples for each defect type are limited and imbalanced. Moreover, the functions are partially observed since the pre-tightening process before the pipe tightening process is unobserved. To classify the defect samples based on imbalanced, multichannel, and partially observed functional data is very important but challenging. Thus, we propose an innovative framework known as "Multichannel Partially Observed Functional Modeling for Defect Classification with an Imbalanced Dataset" (MPOFI). The framework leverages the power of deep metric learning in conjunction with a neural network specially crafted for processing functional data. This paper introduces a neural network explicitly tailored for handling multichannel and partially observed functional data, complemented by developing a corresponding loss function for training on imbalanced datasets. The results from a real-world case study demonstrate the superior accuracy of our framework when compared to existing benchmarks.

Tensor-based process control and monitoring for semiconductor manufacturing with unstable disturbances

With the development and popularity of sensors installed in manufacturing systems, complex data are collected during manufacturing processes, which brings challenges for traditional process control methods. This paper proposes a novel process control and monitoring method for the complex structure of high-dimensional image-based overlay errors (modeled in tensor form), which are collected in semiconductor manufacturing processes. The proposed method aims to reduce overlay errors using limited control recipes. We first build a high-dimensional process model and propose different tensor-on-vector regression algorithms to estimate parameters in the model to alleviate the curse of dimensionality. Then, based on the estimate of tensor parameters, the exponentially weighted moving average (EWMA) controller for tensor data is designed whose stability is theoretically guaranteed. Considering the fact that low-dimensional control recipes cannot compensate for all high-dimensional disturbances on the image, control residuals are monitored to prevent significant drifts of uncontrollable high-dimensional disturbances. Through extensive simulations and real case studies, the performances of parameter estimation algorithms and the EWMA controller in tensor space are evaluated. Compared with existing image-based feedback controllers, the superiority of our method is verified especially when disturbances are not stable.

Ano-SuPs: Multi-size anomaly detection for manufactured products by identifying suspected patches

Image-based systems have gained popularity owing to their capacity to provide rich manufacturing status information, low implementation costs and high acquisition rates. However, the complexity of the image background and various anomaly patterns pose new challenges to existing matrix decomposition methods, which are inadequate for modeling requirements. Moreover, the uncertainty of the anomaly can cause anomaly contamination problems, making the designed model and method highly susceptible to external disturbances. To address these challenges, we propose a two-stage strategy anomaly detection method that detects anomalies by identifying suspected patches (Ano-SuPs). Specifically, we propose to detect the patches with anomalies by reconstructing the input image twice: the first step is to obtain a set of normal patches by removing those suspected patches, and the second step is to use those normal patches to refine the identification of the patches with anomalies. To demonstrate its effectiveness, we evaluate the proposed method systematically through simulation experiments and case studies. We further identified the key parameters and designed steps that impact the model's performance and efficiency.

MFRL-BI: Design of a Model-free Reinforcement Learning Process Control Scheme by Using Bayesian Inference

Design of process control scheme is critical for quality assurance to reduce variations in manufacturing systems. Taking semiconductor manufacturing as an example, extensive literature focuses on control optimization based on certain process models (usually linear models), which are obtained by experiments before a manufacturing process starts. However, in real applications, pre-defined models may not be accurate, especially for a complex manufacturing system. To tackle model inaccuracy, we propose a model-free reinforcement learning (MFRL) approach to conduct experiments and optimize control simultaneously according to real-time data. Specifically, we design a novel MFRL control scheme by updating the distribution of disturbances using Bayesian inference to reduce their large variations during manufacturing processes. As a result, the proposed MFRL controller is demonstrated to perform well in a nonlinear chemical mechanical planarization (CMP) process when the process model is unknown. Theoretical properties are also guaranteed when disturbances are additive. The numerical studies also demonstrate the effectiveness and efficiency of our methodology.

Temporal-Relational Hypergraph Tri-Attention Networks for Stock Trend Prediction

Predicting the future price trends of stocks is a challenging yet intriguing problem given its critical role to help investors make profitable decisions. In this paper, we present a collaborative temporal-relational modeling framework for end-to-end stock trend prediction. The temporal dynamics of stocks is firstly captured with an attention-based recurrent neural network. Then, different from existing studies relying on the pairwise correlations between stocks, we argue that stocks are naturally connected as a collective group, and introduce the hypergraph structures to jointly characterize the stock group-wise relationships of industry-belonging and fund-holding. A novel hypergraph tri-attention network (HGTAN) is proposed to augment the hypergraph convolutional networks with a hierarchical organization of intra-hyperedge, inter-hyperedge, and inter-hypergraph attention modules. In this manner, HGTAN adaptively determines the importance of nodes, hyperedges, and hypergraphs during the information propagation among stocks, so that the potential synergies between stock movements can be fully exploited. Extensive experiments on real-world data demonstrate the effectiveness of our approach. Also, the results of investment simulation show that our approach can achieve a more desirable risk-adjusted return. The data and codes of our work have been released at https://github.com/lixiaojieff/HGTAN.

SOE-Net: A Self-Attention and Orientation Encoding Network for Point Cloud based Place Recognition

We tackle the problem of place recognition from point cloud data and introduce a self-attention and orientation encoding network (SOE-Net) that fully explores the relationship between points and incorporates long-range context into point-wise local descriptors. Local information of each point from eight orientations is captured in a PointOE module, whereas long-range feature dependencies among local descriptors are captured with a self-attention unit. Moreover, we propose a novel loss function called Hard Positive Hard Negative quadruplet loss (HPHN quadruplet), that achieves better performance than the commonly used metric learning loss. Experiments on various benchmark datasets demonstrate promising performance of the proposed network. It significantly outperforms the current state-of-the-art approaches - the average recall at top 1 retrieval on the Oxford RobotCar dataset is improved by over 16%. Codes and the trained model will be made publicly available.

DH3D: Deep Hierarchical 3D Descriptors for Robust Large-Scale 6DoF Relocalization

For relocalization in large-scale point clouds, we propose the first approach that unifies global place recognition and local 6DoF pose refinement. To this end, we design a Siamese network that jointly learns 3D local feature detection and description directly from raw 3D points. It integrates FlexConv and Squeeze-and-Excitation (SE) to assure that the learned local descriptor captures multi-level geometric information and channel-wise relations. For detecting 3D keypoints we predict the discriminativeness of the local descriptors in an unsupervised manner. We generate the global descriptor by directly aggregating the learned local descriptors with an effective attention mechanism. In this way, local and global 3D descriptors are inferred in one single forward pass. Experiments on various benchmarks demonstrate that our method achieves competitive results for both global point cloud retrieval and local point cloud registration in comparison to state-of-the-art approaches. To validate the generalizability and robustness of our 3D keypoints, we demonstrate that our method also performs favorably without fine-tuning on the registration of point clouds that were generated by a visual SLAM system. Code and related materials are available at https://vision.in.tum.de/research/vslam/dh3d.