Picture for Fan Min

Fan Min

Sequential three-way decisions with a single hidden layer feedforward neural network

Add code
Mar 14, 2023
Viaarxiv icon

Test-cost-sensitive attribute reduction of data with normal distribution measurement errors

Add code
Jun 03, 2013
Figure 1 for Test-cost-sensitive attribute reduction of data with normal distribution measurement errors
Figure 2 for Test-cost-sensitive attribute reduction of data with normal distribution measurement errors
Figure 3 for Test-cost-sensitive attribute reduction of data with normal distribution measurement errors
Figure 4 for Test-cost-sensitive attribute reduction of data with normal distribution measurement errors
Viaarxiv icon

Minimal cost feature selection of data with normal distribution measurement errors

Add code
Jun 03, 2013
Figure 1 for Minimal cost feature selection of data with normal distribution measurement errors
Figure 2 for Minimal cost feature selection of data with normal distribution measurement errors
Figure 3 for Minimal cost feature selection of data with normal distribution measurement errors
Figure 4 for Minimal cost feature selection of data with normal distribution measurement errors
Viaarxiv icon

Cost-Sensitive Feature Selection of Data with Errors

Add code
Jun 03, 2013
Viaarxiv icon

Characteristic matrix of covering and its application to boolean matrix decomposition and axiomatization

Add code
Mar 03, 2013
Viaarxiv icon

Cost-sensitive C4.5 with post-pruning and competition

Add code
Nov 17, 2012
Figure 1 for Cost-sensitive C4.5 with post-pruning and competition
Figure 2 for Cost-sensitive C4.5 with post-pruning and competition
Figure 3 for Cost-sensitive C4.5 with post-pruning and competition
Figure 4 for Cost-sensitive C4.5 with post-pruning and competition
Viaarxiv icon

Feature selection with test cost constraint

Add code
Sep 25, 2012
Figure 1 for Feature selection with test cost constraint
Figure 2 for Feature selection with test cost constraint
Figure 3 for Feature selection with test cost constraint
Figure 4 for Feature selection with test cost constraint
Viaarxiv icon