RepMet: Representative-based metric learning for classification and one-shot object detection

Distance metric learning (DML) has been successfully applied to object classification, both in the standard regime of rich training data and in the few-shot scenario, where each category is represented by only few examples. In this work, we propose a new method for DML, featuring a joint learning of the embedding space and of the data distribution of the training categories, in a single training process. Our method improves upon leading algorithms for DML-based object classification. Furthermore, it opens the door for a new task in Computer Vision - a few-shot object detection, since the proposed DML architecture can be naturally embedded as the classification head of any standard object detector. In numerous experiments, we achieve state-of-the-art classification results on a variety of fine-grained datasets, and offer the community a benchmark on the few-shot detection task, performed on the Imagenet-LOC dataset. The code will be made available upon acceptance.