DiffV2IR: Visible-to-Infrared Diffusion Model via Vision-Language Understanding

The task of translating visible-to-infrared images (V2IR) is inherently challenging due to three main obstacles: 1) achieving semantic-aware translation, 2) managing the diverse wavelength spectrum in infrared imagery, and 3) the scarcity of comprehensive infrared datasets. Current leading methods tend to treat V2IR as a conventional image-to-image synthesis challenge, often overlooking these specific issues. To address this, we introduce DiffV2IR, a novel framework for image translation comprising two key elements: a Progressive Learning Module (PLM) and a Vision-Language Understanding Module (VLUM). PLM features an adaptive diffusion model architecture that leverages multi-stage knowledge learning to infrared transition from full-range to target wavelength. To improve V2IR translation, VLUM incorporates unified Vision-Language Understanding. We also collected a large infrared dataset, IR-500K, which includes 500,000 infrared images compiled by various scenes and objects under various environmental conditions. Through the combination of PLM, VLUM, and the extensive IR-500K dataset, DiffV2IR markedly improves the performance of V2IR. Experiments validate DiffV2IR's excellence in producing high-quality translations, establishing its efficacy and broad applicability. The code, dataset, and DiffV2IR model will be available at https://github.com/LidongWang-26/DiffV2IR.

PA-CLIP: Enhancing Zero-Shot Anomaly Detection through Pseudo-Anomaly Awareness

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.