Sequential PatchCore: Anomaly Detection for Surface Inspection using Synthetic Impurities

The appearance of surface impurities (e.g., water stains, fingerprints, stickers) is an often-mentioned issue that causes degradation of automated visual inspection systems. At the same time, synthetic data generation techniques for visual surface inspection have focused primarily on generating perfect examples and defects, disregarding impurities. This study highlights the importance of considering impurities when generating synthetic data. We introduce a procedural method to include photorealistic water stains in synthetic data. The synthetic datasets are generated to correspond to real datasets and are further used to train an anomaly detection model and investigate the influence of water stains. The high-resolution images used for surface inspection lead to memory bottlenecks during anomaly detection training. To address this, we introduce Sequential PatchCore - a method to build coresets sequentially and make training on large images using consumer-grade hardware tractable. This allows us to perform transfer learning using coresets pre-trained on different dataset versions. Our results show the benefits of using synthetic data for pre-training an explicit coreset anomaly model and the extended performance benefits of finetuning the coreset using real data. We observed how the impurities and labelling ambiguity lower the model performance and have additionally reported the defect-wise recall to provide an industrially relevant perspective on model performance.

SYNOSIS: Image synthesis pipeline for machine vision in metal surface inspection

The use of machine learning (ML) methods for development of robust and flexible visual inspection system has shown promising. However their performance is highly dependent on the amount and diversity of training data. This is often restricted not only due to costs but also due to a wide variety of defects and product surfaces which occur with varying frequency. As such, one can not guarantee that the acquired dataset contains enough defect and product surface occurrences which are needed to develop a robust model. Using parametric synthetic dataset generation, it is possible to avoid these issues. In this work, we introduce a complete pipeline which describes in detail how to approach image synthesis for surface inspection - from first acquisition, to texture and defect modeling, data generation, comparison to real data and finally use of the synthetic data to train a defect segmentation model. The pipeline is in detail evaluated for milled and sandblasted aluminum surfaces. In addition to providing an in-depth view into each step, discussion of chosen methods, and presentation of ML results, we provide a comprehensive dual dataset containing both real and synthetic images.