Picture for Michael Gaultois

Michael Gaultois

Pushing the Pareto front of band gap and permittivity: ML-guided search for dielectric materials

Add code
Jan 11, 2024
Viaarxiv icon

Random projections and Kernelised Leave One Cluster Out Cross-Validation: Universal baselines and evaluation tools for supervised machine learning for materials properties

Add code
Jun 17, 2022
Figure 1 for Random projections and Kernelised Leave One Cluster Out Cross-Validation: Universal baselines and evaluation tools for supervised machine learning for materials properties
Figure 2 for Random projections and Kernelised Leave One Cluster Out Cross-Validation: Universal baselines and evaluation tools for supervised machine learning for materials properties
Figure 3 for Random projections and Kernelised Leave One Cluster Out Cross-Validation: Universal baselines and evaluation tools for supervised machine learning for materials properties
Figure 4 for Random projections and Kernelised Leave One Cluster Out Cross-Validation: Universal baselines and evaluation tools for supervised machine learning for materials properties
Viaarxiv icon