2.5D Super-Resolution Approaches for X-ray Computed Tomography-based Inspection of Additively Manufactured Parts

X-ray computed tomography (XCT) is a key tool in non-destructive evaluation of additively manufactured (AM) parts, allowing for internal inspection and defect detection. Despite its widespread use, obtaining high-resolution CT scans can be extremely time consuming. This issue can be mitigated by performing scans at lower resolutions; however, reducing the resolution compromises spatial detail, limiting the accuracy of defect detection. Super-resolution algorithms offer a promising solution for overcoming resolution limitations in XCT reconstructions of AM parts, enabling more accurate detection of defects. While 2D super-resolution methods have demonstrated state-of-the-art performance on natural images, they tend to under-perform when directly applied to XCT slices. On the other hand, 3D super-resolution methods are computationally expensive, making them infeasible for large-scale applications. To address these challenges, we propose a 2.5D super-resolution approach tailored for XCT of AM parts. Our method enhances the resolution of individual slices by leveraging multi-slice information from neighboring 2D slices without the significant computational overhead of full 3D methods. Specifically, we use neighboring low-resolution slices to super-resolve the center slice, exploiting inter-slice spatial context while maintaining computational efficiency. This approach bridges the gap between 2D and 3D methods, offering a practical solution for high-throughput defect detection in AM parts.

ResSR: A Residual Approach to Super-Resolving Multispectral Images

Multispectral imaging sensors typically have wavelength-dependent resolution, which reduces the ability to distinguish small features in some spectral bands. Existing super-resolution methods upsample a multispectral image (MSI) to achieve a common resolution across all bands but are typically sensor-specific, computationally expensive, and may assume invariant image statistics across multiple length scales. In this paper, we introduce ResSR, an efficient and modular residual-based method for super-resolving the lower-resolution bands of a multispectral image. ResSR uses singular value decomposition (SVD) to identify correlations across spectral bands and then applies a residual correction process that corrects only the high-spatial frequency components of the upsampled bands. The SVD formulation improves the conditioning and simplifies the super-resolution problem, and the residual method retains accurate low-spatial frequencies from the measured data while incorporating high-spatial frequency detail from the SVD solution. While ResSR is formulated as the solution to an optimization problem, we derive an approximate closed-form solution that is fast and accurate. We formulate ResSR for any number of distinct resolutions, enabling easy application to any MSI. In a series of experiments on simulated and measured Sentinel-2 MSIs, ResSR is shown to produce image quality comparable to or better than alternative algorithms. However, it is computationally faster and can run on larger images, making it useful for processing large data sets.