Exploit High-Dimensional RIS Information to Localization: What Is the Impact of Faulty Element?

This paper proposes a novel localization algorithm using the reconfigurable intelligent surface (RIS) received signal, i.e., RIS information. Compared with BS received signal, i.e., BS information, RIS information offers higher dimension and richer feature set, thereby providing an enhanced capacity to distinguish positions of the mobile users (MUs). Additionally, we address a practical scenario where RIS contains some unknown (number and places) faulty elements that cannot receive signals. Initially, we employ transfer learning to design a two-phase transfer learning (TPTL) algorithm, designed for accurate detection of faulty elements. Then our objective is to regain the information lost from the faulty elements and reconstruct the complete high-dimensional RIS information for localization. To this end, we propose a transfer-enhanced dual-stage (TEDS) algorithm. In \emph{Stage I}, we integrate the CNN and variational autoencoder (VAE) to obtain the RIS information, which in \emph{Stage II}, is input to the transferred DenseNet 121 to estimate the location of the MU. To gain more insight, we propose an alternative algorithm named transfer-enhanced direct fingerprint (TEDF) algorithm which only requires the BS information. The comparison between TEDS and TEDF reveals the effectiveness of faulty element detection and the benefits of utilizing the high-dimensional RIS information for localization. Besides, our empirical results demonstrate that the performance of the localization algorithm is dominated by the high-dimensional RIS information and is robust to unoptimized phase shifts and signal-to-noise ratio (SNR).