Abstract:Characterizing materials using electron micrographs is crucial in areas such as semiconductors and quantum materials. Traditional classification methods falter due to the intricatestructures of these micrographs. This study introduces an innovative architecture that leverages the generative capabilities of zero-shot prompting in Large Language Models (LLMs) such as GPT-4(language only), the predictive ability of few-shot (in-context) learning in Large Multimodal Models (LMMs) such as GPT-4(V)ision, and fuses knowledge across image based and linguistic insights for accurate nanomaterial category prediction. This comprehensive approach aims to provide a robust solution for the automated nanomaterial identification task in semiconductor manufacturing, blending performance, efficiency, and interpretability. Our method surpasses conventional approaches, offering precise nanomaterial identification and facilitating high-throughput screening.
Abstract:Material characterization using electron micrographs is a crucial but challenging task with applications in various fields, such as semiconductors, quantum materials, batteries, etc. The challenges in categorizing electron micrographs include but are not limited to the complexity of patterns, high level of detail, and imbalanced data distribution(long-tail distribution). Existing methods have difficulty in modeling the complex relational structure in electron micrographs, hindering their ability to effectively capture the complex relationships between different spatial regions of micrographs. We propose a hypergraph neural network(HgNN) backbone architecture, a conceptually alternative approach, to better model the complex relationships in electron micrographs and improve material characterization accuracy. By utilizing cost-effective GPU hardware, our proposed framework outperforms popular baselines. The results of the ablation studies demonstrate that the proposed framework is effective in achieving state-of-the-art performance on benchmark datasets and efficient in terms of computational and memory requirements for handling large-scale electron micrograph-based datasets.