Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification

In integrated circuit design, the analysis of wafer map patterns is critical to improve yield and detect manufacturing issues. We develop Wafer2Spike, an architecture for wafer map pattern classification using a spiking neural network (SNN), and demonstrate that a well-trained SNN achieves superior performance compared to deep neural network-based solutions. Wafer2Spike achieves an average classification accuracy of 98\% on the WM-811k wafer benchmark dataset. It is also superior to existing approaches for classifying defect patterns that are underrepresented in the original dataset. Wafer2Spike achieves this improved precision with great computational efficiency.

SafeRNet: Safe Transportation Routing in the era of Internet of Vehicles and Mobile Crowd Sensing

World wide road traffic fatality and accident rates are high, and this is true even in technologically advanced countries like the USA. Despite the advances in Intelligent Transportation Systems, safe transportation routing i.e., finding safest routes is largely an overlooked paradigm. In recent years, large amount of traffic data has been produced by people, Internet of Vehicles and Internet of Things (IoT). Also, thanks to advances in cloud computing and proliferation of mobile communication technologies, it is now possible to perform analysis on vast amount of generated data (crowd sourced) and deliver the result back to users in real time. This paper proposes SafeRNet, a safe route computation framework which takes advantage of these technologies to analyze streaming traffic data and historical data to effectively infer safe routes and deliver them back to users in real time. SafeRNet utilizes Bayesian network to formulate safe route model. Furthermore, a case study is presented to demonstrate the effectiveness of our approach using real traffic data. SafeRNet intends to improve drivers safety in a modern technology rich transportation system.