Abstract:Physics-informed neural networks (PINNs) have recently emerged as a promising way to compute the solutions of partial differential equations (PDEs) using deep neural networks. However, despite their significant success in various fields, it remains unclear in many aspects how to effectively train PINNs if the solutions of PDEs exhibit stiff behaviors or high frequencies. In this paper, we propose a new method for training PINNs using variable-scaling techniques. This method is simple and it can be applied to a wide range of problems including PDEs with rapidly-varying solutions. Throughout various numerical experiments, we will demonstrate the effectiveness of the proposed method for these problems and confirm that it can significantly improve the training efficiency and performance of PINNs. Furthermore, based on the analysis of the neural tangent kernel (NTK), we will provide theoretical evidence for this phenomenon and show that our methods can indeed improve the performance of PINNs.
Abstract:In this paper, we provide a theoretical analysis of a type of operator learning method without data reliance based on the classical finite element approximation, which is called the finite element operator network (FEONet). We first establish the convergence of this method for general second-order linear elliptic PDEs with respect to the parameters for neural network approximation. In this regard, we address the role of the condition number of the finite element matrix in the convergence of the method. Secondly, we derive an explicit error estimate for the self-adjoint case. For this, we investigate some regularity properties of the solution in certain function classes for a neural network approximation, verifying the sufficient condition for the solution to have the desired regularity. Finally, we will also conduct some numerical experiments that support the theoretical findings, confirming the role of the condition number of the finite element matrix in the overall convergence.
Abstract:Partial differential equations (PDEs) underlie our understanding and prediction of natural phenomena across numerous fields, including physics, engineering, and finance. However, solving parametric PDEs is a complex task that necessitates efficient numerical methods. In this paper, we propose a novel approach for solving parametric PDEs using a Finite Element Operator Network (FEONet). Our proposed method leverages the power of deep learning in conjunction with traditional numerical methods, specifically the finite element method, to solve parametric PDEs in the absence of any paired input-output training data. We demonstrate the effectiveness of our approach on several benchmark problems and show that it outperforms existing state-of-the-art methods in terms of accuracy, generalization, and computational flexibility. Our FEONet framework shows potential for application in various fields where PDEs play a crucial role in modeling complex domains with diverse boundary conditions and singular behavior. Furthermore, we provide theoretical convergence analysis to support our approach, utilizing finite element approximation in numerical analysis.
Abstract:In this paper, we perform the convergence analysis of unsupervised Legendre--Galerkin neural networks (ULGNet), a deep-learning-based numerical method for solving partial differential equations (PDEs). Unlike existing deep learning-based numerical methods for PDEs, the ULGNet expresses the solution as a spectral expansion with respect to the Legendre basis and predicts the coefficients with deep neural networks by solving a variational residual minimization problem. Since the corresponding loss function is equivalent to the residual induced by the linear algebraic system depending on the choice of basis functions, we prove that the minimizer of the discrete loss function converges to the weak solution of the PDEs. Numerical evidence will also be provided to support the theoretical result. Key technical tools include the variant of the universal approximation theorem for bounded neural networks, the analysis of the stiffness and mass matrices, and the uniform law of large numbers in terms of the Rademacher complexity.
Abstract:In semiconductor manufacturing, wafer map defect pattern provides critical information for facility maintenance and yield management, so the classification of defect patterns is one of the most important tasks in the manufacturing process. In this paper, we propose a novel way to represent the shape of the defect pattern as a finite-dimensional vector, which will be used as an input for a neural network algorithm for classification. The main idea is to extract the topological features of each pattern by using the theory of persistent homology from topological data analysis (TDA). Through some experiments with a simulated dataset, we show that the proposed method is faster and much more efficient in training with higher accuracy, compared with the method using convolutional neural networks (CNN) which is the most common approach for wafer map defect pattern classification. Moreover, our method outperforms the CNN-based method when the number of training data is not enough and is imbalanced.