Deep reinforcement learning for quantum multiparameter estimation

Estimation of physical quantities is at the core of most scientific research and the use of quantum devices promises to enhance its performances. In real scenarios, it is fundamental to consider that the resources are limited and Bayesian adaptive estimation represents a powerful approach to efficiently allocate, during the estimation process, all the available resources. However, this framework relies on the precise knowledge of the system model, retrieved with a fine calibration that often results computationally and experimentally demanding. Here, we introduce a model-free and deep learning-based approach to efficiently implement realistic Bayesian quantum metrology tasks accomplishing all the relevant challenges, without relying on any a-priori knowledge on the system. To overcome this need, a neural network is trained directly on experimental data to learn the multiparameter Bayesian update. Then, the system is set at its optimal working point through feedbacks provided by a reinforcement learning algorithm trained to reconstruct and enhance experiment heuristics of the investigated quantum sensor. Notably, we prove experimentally the achievement of higher estimation performances than standard methods, demonstrating the strength of the combination of these two black-box algorithms on an integrated photonic circuit. This work represents an important step towards fully artificial intelligence-based quantum metrology.

Pattern recognition techniques for Boson Sampling validation

The difficulty of validating large-scale quantum devices, such as Boson Samplers, poses a major challenge for any research program that aims to show quantum advantages over classical hardware. To address this problem, we propose a novel data-driven approach wherein models are trained to identify common pathologies using unsupervised machine learning methods. We illustrate this idea by training a classifier that exploits K-means clustering to distinguish between Boson Samplers that use indistinguishable photons from those that do not. We train the model on numerical simulations of small-scale Boson Samplers and then validate the pattern recognition technique on larger numerical simulations as well as on photonic chips in both traditional Boson Sampling and scattershot experiments. The effectiveness of such method relies on particle-type-dependent internal correlations present in the output distributions. This approach performs substantially better on the test data than previous methods and underscores the ability to further generalize its operation beyond the scope of the examples that it was trained on.