Looking for Tiny Defects via Forward-Backward Feature Transfer

Motivated by efficiency requirements, most anomaly detection and segmentation (AD&S) methods focus on processing low-resolution images, e.g., $224\times 224$ pixels, obtained by downsampling the original input images. In this setting, downsampling is typically applied also to the provided ground-truth defect masks. Yet, as numerous industrial applications demand identification of both large and tiny defects, the above-described protocol may fall short in providing a realistic picture of the actual performance attainable by current methods. Hence, in this work, we introduce a novel benchmark that evaluates methods on the original, high-resolution image and ground-truth masks, focusing on segmentation performance as a function of the size of anomalies. Our benchmark includes a metric that captures robustness with respect to defect size, i.e., the ability of a method to preserve good localization from large anomalies to tiny ones. Furthermore, we introduce an AD&S approach based on a novel Teacher-Student paradigm which relies on two shallow MLPs (the Students) that learn to transfer patch features across the layers of a frozen vision transformer (the Teacher). By means of our benchmark, we evaluate our proposal and other recent AD&S methods on high-resolution inputs containing large and tiny defects. Our proposal features the highest robustness to defect size, runs at the fastest speed, yields state-of-the-art performance on the MVTec AD dataset and state-of-the-art segmentation performance on the VisA dataset.

Test Time Training for Industrial Anomaly Segmentation

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

Multimodal Industrial Anomaly Detection by Crossmodal Feature Mapping

The paper explores the industrial multimodal Anomaly Detection (AD) task, which exploits point clouds and RGB images to localize anomalies. We introduce a novel light and fast framework that learns to map features from one modality to the other on nominal samples. At test time, anomalies are detected by pinpointing inconsistencies between observed and mapped features. Extensive experiments show that our approach achieves state-of-the-art detection and segmentation performance in both the standard and few-shot settings on the MVTec 3D-AD dataset while achieving faster inference and occupying less memory than previous multimodal AD methods. Moreover, we propose a layer-pruning technique to improve memory and time efficiency with a marginal sacrifice in performance.

Learning Depth Estimation for Transparent and Mirror Surfaces

Inferring the depth of transparent or mirror (ToM) surfaces represents a hard challenge for either sensors, algorithms, or deep networks. We propose a simple pipeline for learning to estimate depth properly for such surfaces with neural networks, without requiring any ground-truth annotation. We unveil how to obtain reliable pseudo labels by in-painting ToM objects in images and processing them with a monocular depth estimation model. These labels can be used to fine-tune existing monocular or stereo networks, to let them learn how to deal with ToM surfaces. Experimental results on the Booster dataset show the dramatic improvements enabled by our remarkably simple proposal.

Booster: a Benchmark for Depth from Images of Specular and Transparent Surfaces

Estimating depth from images nowadays yields outstanding results, both in terms of in-domain accuracy and generalization. However, we identify two main challenges that remain open in this field: dealing with non-Lambertian materials and effectively processing high-resolution images. Purposely, we propose a novel dataset that includes accurate and dense ground-truth labels at high resolution, featuring scenes containing several specular and transparent surfaces. Our acquisition pipeline leverages a novel deep space-time stereo framework, enabling easy and accurate labeling with sub-pixel precision. The dataset is composed of 606 samples collected in 85 different scenes, each sample includes both a high-resolution pair (12 Mpx) as well as an unbalanced stereo pair (Left: 12 Mpx, Right: 1.1 Mpx). Additionally, we provide manually annotated material segmentation masks and 15K unlabeled samples. We divide the dataset into a training set, and two testing sets, the latter devoted to the evaluation of stereo and monocular depth estimation networks respectively to highlight the open challenges and future research directions in this field.