A 0.65-pJ/bit 3.6-TB/s/mm I/O Interface with XTalk Minimizing Affine Signaling for Next-Generation HBM with High Interconnect Density

This paper presents an I/O interface with Xtalk Minimizing Affine Signaling (XMAS), which is designed to support high-speed data transmission in die-to-die communication over silicon interposers or similar high-density interconnects susceptible to crosstalk. The operating principles of XMAS are elucidated through rigorous analyses, and its advantages over existing signaling are validated through numerical experiments. XMAS not only demonstrates exceptional crosstalk removing capabilities but also exhibits robustness against noise, especially simultaneous switching noise. Fabricated in a 28-nm CMOS process, the prototype XMAS transceiver achieves an edge density of 3.6TB/s/mm and an energy efficiency of 0.65pJ/b. Compared to the single-ended signaling, the crosstalk-induced peak-to-peak jitter of the received eye with XMAS is reduced by 75% at 10GS/s/pin data rate, and the horizontal eye opening extends to 0.2UI at a bit error rate < 10$^{-12}$.