Unified Anomaly Detection methods on Edge Device using Knowledge Distillation and Quantization

With the rapid advances in deep learning and smart manufacturing in Industry 4.0, there is an imperative for high-throughput, high-performance, and fully integrated visual inspection systems. Most anomaly detection approaches using defect detection datasets, such as MVTec AD, employ one-class models that require fitting separate models for each class. On the contrary, unified models eliminate the need for fitting separate models for each class and significantly reduce cost and memory requirements. Thus, in this work, we experiment with considering a unified multi-class setup. Our experimental study shows that multi-class models perform at par with one-class models for the standard MVTec AD dataset. Hence, this indicates that there may not be a need to learn separate object/class-wise models when the object classes are significantly different from each other, as is the case of the dataset considered. Furthermore, we have deployed three different unified lightweight architectures on the CPU and an edge device (NVIDIA Jetson Xavier NX). We analyze the quantized multi-class anomaly detection models in terms of latency and memory requirements for deployment on the edge device while comparing quantization-aware training (QAT) and post-training quantization (PTQ) for performance at different precision widths. In addition, we explored two different methods of calibration required in post-training scenarios and show that one of them performs notably better, highlighting its importance for unsupervised tasks. Due to quantization, the performance drop in PTQ is further compensated by QAT, which yields at par performance with the original 32-bit Floating point in two of the models considered.

Attend, Distill, Detect: Attention-aware Entropy Distillation for Anomaly Detection

Unsupervised anomaly detection encompasses diverse applications in industrial settings where a high-throughput and precision is imperative. Early works were centered around one-class-one-model paradigm, which poses significant challenges in large-scale production environments. Knowledge-distillation based multi-class anomaly detection promises a low latency with a reasonably good performance but with a significant drop as compared to one-class version. We propose a DCAM (Distributed Convolutional Attention Module) which improves the distillation process between teacher and student networks when there is a high variance among multiple classes or objects. Integrated multi-scale feature matching strategy to utilise a mixture of multi-level knowledge from the feature pyramid of the two networks, intuitively helping in detecting anomalies of varying sizes which is also an inherent problem in the multi-class scenario. Briefly, our DCAM module consists of Convolutional Attention blocks distributed across the feature maps of the student network, which essentially learns to masks the irrelevant information during student learning alleviating the "cross-class interference" problem. This process is accompanied by minimizing the relative entropy using KL-Divergence in Spatial dimension and a Channel-wise Cosine Similarity between the same feature maps of teacher and student. The losses enables to achieve scale-invariance and capture non-linear relationships. We also highlight that the DCAM module would only be used during training and not during inference as we only need the learned feature maps and losses for anomaly scoring and hence, gaining a performance gain of 3.92% than the multi-class baseline with a preserved latency.