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Stefan Sandfeld

Self-Supervised Learning in Electron Microscopy: Towards a Foundation Model for Advanced Image Analysis

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Feb 28, 2024
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Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer

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Feb 20, 2024
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DISO: A Domain Ontology for Modeling Dislocations in Crystalline Materials

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Jan 04, 2024
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Machine learning for structure-guided materials and process design

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Dec 22, 2023
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Modeling Dislocation Dynamics Data Using Semantic Web Technologies

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Sep 13, 2023
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Unsupervised Learning of Nanoindentation Data to Infer Microstructural Details of Complex Materials

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Sep 12, 2023
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Instance Segmentation of Dislocations in TEM Images

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Sep 07, 2023
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Efficient Surrogate Models for Materials Science Simulations: Machine Learning-based Prediction of Microstructure Properties

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Sep 01, 2023
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Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data"

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Jul 12, 2023
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Automated analysis of continuum fields from atomistic simulations using statistical machine learning

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Jun 16, 2022
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