GRPO with State Mutations: Improving LLM-Based Hardware Test Plan Generation

RTL design often relies heavily on ad-hoc testbench creation early in the design cycle. While large language models (LLMs) show promise for RTL code generation, their ability to reason about hardware specifications and generate targeted test plans remains largely unexplored. We present the first systematic study of LLM reasoning capabilities for RTL verification stimuli generation, establishing a two-stage framework that decomposes test plan generation from testbench execution. Our benchmark reveals that state-of-the-art models, including DeepSeek-R1 and Claude-4.0-Sonnet, achieve only 15.7-21.7% success rates on generating stimuli that pass golden RTL designs. To improve LLM generated stimuli, we develop a comprehensive training methodology combining supervised fine-tuning with a novel reinforcement learning approach, GRPO with State Mutation (GRPO-SMu), which enhances exploration by varying input mutations. Our approach leverages a tree-based branching mutation strategy to construct training data comprising equivalent and mutated trees, moving beyond linear mutation approaches to provide rich learning signals. Training on this curated dataset, our 7B parameter model achieves a 33.3% golden test pass rate and a 13.9% mutation detection rate, representing a 17.6% absolute improvement over baseline and outperforming much larger general-purpose models. These results demonstrate that specialized training methodologies can significantly enhance LLM reasoning capabilities for hardware verification tasks, establishing a foundation for automated sub-unit testing in semiconductor design workflows.

LEDRO: LLM-Enhanced Design Space Reduction and Optimization for Analog Circuits

Traditional approaches for designing analog circuits are time-consuming and require significant human expertise. Existing automation efforts using methods like Bayesian Optimization (BO) and Reinforcement Learning (RL) are sub-optimal and costly to generalize across different topologies and technology nodes. In our work, we introduce a novel approach, LEDRO, utilizing Large Language Models (LLMs) in conjunction with optimization techniques to iteratively refine the design space for analog circuit sizing. LEDRO is highly generalizable compared to other RL and BO baselines, eliminating the need for design annotation or model training for different topologies or technology nodes. We conduct a comprehensive evaluation of our proposed framework and baseline on 22 different Op-Amp topologies across four FinFET technology nodes. Results demonstrate the superior performance of LEDRO as it outperforms our best baseline by an average of 13% FoM improvement with 2.15x speed-up on low complexity Op-Amps and 48% FoM improvement with 1.7x speed-up on high complexity Op-Amps. This highlights LEDRO's effective performance, efficiency, and generalizability.