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Arthi Jayaraman

Machine Learning for Identifying Grain Boundaries in Scanning Electron Microscopy (SEM) Images of Nanoparticle Superlattices

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Jan 07, 2025
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Machine Learning for Analyzing Atomic Force Microscopy (AFM) Images Generated from Polymer Blends

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Sep 15, 2024
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Pair-Variational Autoencoders (PairVAE) for Linking and Cross-Reconstruction of Characterization Data from Complementary Structural Characterization Techniques

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May 25, 2023
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Self-supervised machine learning model for analysis of nanowire morphologies from transmission electron microscopy images

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Mar 25, 2022
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