Efficient and effective on-line detection and correction of bad pixels can improve yield and increase the expected lifetime of image sensors. This paper presents a comprehensive Deep Learning (DL) based on-line detection-correction approach, suitable for a wide range of pixel corruption rates. A confidence calibrated segmentation approach is introduced, which achieves nearly perfect bad pixel detection, even with few training samples. A computationally light-weight correction algorithm is proposed for low rates of pixel corruption, that surpasses the accuracy of traditional interpolation-based techniques. We also propose an autoencoder based image reconstruction approach which alleviates the need for prior bad pixel detection and yields promising results for high rates of pixel corruption. Unlike previous methods, which use proprietary images, we demonstrate the efficacy of the proposed methods on the open-source Samsung S7 ISP and MIT-Adobe FiveK datasets. Our approaches yield up to 99.6% detection accuracy with <0.6% false positives and corrected images within 1.5% average pixel error from 70% corrupted images.