In this letter, we quantify the impact of device limitations on the classification accuracy of an artificial neural network, where the synaptic weights are implemented in a Ferroelectric FET (FeFET) based in-memory processing architecture. We explore a design-space consisting of the resolution of the analog-to-digital converter, number of bits per FeFET cell, and the neural network depth. We show how the system architecture, training models and overparametrization can address some of the device limitations.