Abstract:Power capacitor device is a widely used reactive power compensation equipment in power transmission and distribution system which can easily have internal fault and therefore affects the safe operation of the power system. An intelligent non-destructive testing (I-NDT) method based on ICT is proposed to test the quality of power capacitors automatically in this study. The internal structure of power capacitors would be scanned by the ICT device and then defects could be recognized by the SSD algorithm. Moreover, the data data augmentation algorithm is used to extend the image set to improve the stability and accuracy of the trained SSD model.