Revealing the Evolution of Order in Materials Microstructures Using Multi-Modal Computer Vision

The development of high-performance materials for microelectronics, energy storage, and extreme environments depends on our ability to describe and direct property-defining microstructural order. Our present understanding is typically derived from laborious manual analysis of imaging and spectroscopy data, which is difficult to scale, challenging to reproduce, and lacks the ability to reveal latent associations needed for mechanistic models. Here, we demonstrate a multi-modal machine learning (ML) approach to describe order from electron microscopy analysis of the complex oxide La$_{1-x}$Sr$_x$FeO$_3$. We construct a hybrid pipeline based on fully and semi-supervised classification, allowing us to evaluate both the characteristics of each data modality and the value each modality adds to the ensemble. We observe distinct differences in the performance of uni- and multi-modal models, from which we draw general lessons in describing crystal order using computer vision.

Unsupervised segmentation of irradiation$\unicode{x2010}$induced order$\unicode{x2010}$disorder phase transitions in electron microscopy

We present a method for the unsupervised segmentation of electron microscopy images, which are powerful descriptors of materials and chemical systems. Images are oversegmented into overlapping chips, and similarity graphs are generated from embeddings extracted from a domain$\unicode{x2010}$pretrained convolutional neural network (CNN). The Louvain method for community detection is then applied to perform segmentation. The graph representation provides an intuitive way of presenting the relationship between chips and communities. We demonstrate our method to track irradiation$\unicode{x2010}$induced amorphous fronts in thin films used for catalysis and electronics. This method has potential for "on$\unicode{x2010}$the$\unicode{x2010}$fly" segmentation to guide emerging automated electron microscopes.