Defect detection using weakly supervised learning

In many real-world scenarios, obtaining large amounts of labeled data can be a daunting task. Weakly supervised learning techniques have gained significant attention in recent years as an alternative to traditional supervised learning, as they enable training models using only a limited amount of labeled data. In this paper, the performance of a weakly supervised classifier to its fully supervised counterpart is compared on the task of defect detection. Experiments are conducted on a dataset of images containing defects, and evaluate the two classifiers based on their accuracy, precision, and recall. Our results show that the weakly supervised classifier achieves comparable performance to the supervised classifier, while requiring significantly less labeled data.

Dens-PU: PU Learning with Density-Based Positive Labeled Augmentation

This study proposes a novel approach for solving the PU learning problem based on an anomaly-detection strategy. Latent encodings extracted from positive-labeled data are linearly combined to acquire new samples. These new samples are used as embeddings to increase the density of positive-labeled data and, thus, define a boundary that approximates the positive class. The further a sample is from the boundary the more it is considered as a negative sample. Once a set of negative samples is obtained, the PU learning problem reduces to binary classification. The approach, named Dens-PU due to its reliance on the density of positive-labeled data, was evaluated using benchmark image datasets, and state-of-the-art results were attained.