Optimal design of experiments in the context of machine-learning inter-atomic potentials: improving the efficiency and transferability of kernel based methods

Data-driven, machine learning (ML) models of atomistic interactions are often based on flexible and non-physical functions that can relate nuanced aspects of atomic arrangements into predictions of energies and forces. As a result, these potentials are as good as the training data (usually results of so-called ab initio simulations) and we need to make sure that we have enough information for a model to become sufficiently accurate, reliable and transferable. The main challenge stems from the fact that descriptors of chemical environments are often sparse high-dimensional objects without a well-defined continuous metric. Therefore, it is rather unlikely that any ad hoc method of choosing training examples will be indiscriminate, and it will be easy to fall into the trap of confirmation bias, where the same narrow and biased sampling is used to generate train- and test- sets. We will demonstrate that classical concepts of statistical planning of experiments and optimal design can help to mitigate such problems at a relatively low computational cost. The key feature of the method we will investigate is that they allow us to assess the informativeness of data (how much we can improve the model by adding/swapping a training example) and verify if the training is feasible with the current set before obtaining any reference energies and forces -- a so-called off-line approach. In other words, we are focusing on an approach that is easy to implement and doesn't require sophisticated frameworks that involve automated access to high-performance computational (HPC).

Digital Fingerprinting of Microstructures

Finding efficient means of fingerprinting microstructural information is a critical step towards harnessing data-centric machine learning approaches. A statistical framework is systematically developed for compressed characterisation of a population of images, which includes some classical computer vision methods as special cases. The focus is on materials microstructure. The ultimate purpose is to rapidly fingerprint sample images in the context of various high-throughput design/make/test scenarios. This includes, but is not limited to, quantification of the disparity between microstructures for quality control, classifying microstructures, predicting materials properties from image data and identifying potential processing routes to engineer new materials with specific properties. Here, we consider microstructure classification and utilise the resulting features over a range of related machine learning tasks, namely supervised, semi-supervised, and unsupervised learning. The approach is applied to two distinct datasets to illustrate various aspects and some recommendations are made based on the findings. In particular, methods that leverage transfer learning with convolutional neural networks (CNNs), pretrained on the ImageNet dataset, are generally shown to outperform other methods. Additionally, dimensionality reduction of these CNN-based fingerprints is shown to have negligible impact on classification accuracy for the supervised learning approaches considered. In situations where there is a large dataset with only a handful of images labelled, graph-based label propagation to unlabelled data is shown to be favourable over discarding unlabelled data and performing supervised learning. In particular, label propagation by Poisson learning is shown to be highly effective at low label rates.