Universal mask for hard X rays

Multiple exposures, of a single illuminated non-configurable mask that is transversely displaced to a number of specified positions, can be used to create any desired distribution of radiant exposure. An experimental proof-of-concept is given for this idea, employing hard X rays. The method is termed "ghost projection", since it may be viewed as a reversed form of classical ghost imaging. The written pattern is arbitrary, up to a tunable constant offset, together with a limiting spatial resolution that is governed by the finest features present in the illuminated mask. The method, which is immune to both proximity-correction and aspect-ratio issues, can be used to make a universal lithographic mask in the hard-X-ray regime. Ghost projection may also be used as a dynamically-configurable beam-shaping element, namely the hard-X-ray equivalent of a spatial light modulator. The idea may be applied to other forms of radiation and matter waves, such as gamma rays, neutrons, electrons, muons, and atomic beams.

Optimizing illumination patterns for classical ghost imaging

Classical ghost imaging is a new paradigm in imaging where the image of an object is not measured directly with a pixelated detector. Rather, the object is subject to a set of illumination patterns and the total interaction of the object, e.g., reflected or transmitted photons or particles, is measured for each pattern with a single-pixel or bucket detector. An image of the object is then computed through the correlation of each pattern and the corresponding bucket value. Assuming no prior knowledge of the object, the set of patterns used to compute the ghost image dictates the image quality. In the visible-light regime, programmable spatial light modulators can generate the illumination patterns. In many other regimes -- such as x rays, electrons, and neutrons -- no such dynamically configurable modulators exist, and patterns are commonly produced by employing a transversely-translated mask. In this paper we explore some of the properties of masks or speckle that should be considered to maximize ghost-image quality, given a certain experimental classical ghost-imaging setup employing a transversely-displaced but otherwise non-configurable mask.