Corn Yield Prediction based on Remotely Sensed Variables Using Variational Autoencoder and Multiple Instance Regression

In the U.S., corn is the most produced crop and has been an essential part of the American diet. To meet the demand for supply chain management and regional food security, accurate and timely large-scale corn yield prediction is attracting more attention in precision agriculture. Recently, remote sensing technology and machine learning methods have been widely explored for crop yield prediction. Currently, most county-level yield prediction models use county-level mean variables for prediction, ignoring much detailed information. Moreover, inconsistent spatial resolution between crop area and satellite sensors results in mixed pixels, which may decrease the prediction accuracy. Only a few works have addressed the mixed pixels problem in large-scale crop yield prediction. To address the information loss and mixed pixels problem, we developed a variational autoencoder (VAE) based multiple instance regression (MIR) model for large-scaled corn yield prediction. We use all unlabeled data to train a VAE and the well-trained VAE for anomaly detection. As a preprocess method, anomaly detection can help MIR find a better representation of every bag than traditional MIR methods, thus better performing in large-scale corn yield prediction. Our experiments showed that variational autoencoder based multiple instance regression (VAEMIR) outperformed all baseline methods in large-scale corn yield prediction. Though a suitable meta parameter is required, VAEMIR shows excellent potential in feature learning and extraction for large-scale corn yield prediction.