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Angus I. Kirkland

On Overlap Ratio in Defocused Electron Ptychography

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Feb 02, 2025
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Compressive Electron Backscatter Diffraction Imaging

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Jul 16, 2024
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In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data

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Jul 12, 2023
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A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy

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Nov 07, 2022
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SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation

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Jul 22, 2022
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