Human Perception-Inspired Grain Segmentation Refinement Using Conditional Random Fields

Accurate segmentation of interconnected line networks, such as grain boundaries in polycrystalline material microstructures, poses a significant challenge due to the fragmented masks produced by conventional computer vision algorithms, including convolutional neural networks. These algorithms struggle with thin masks, often necessitating intricate post-processing for effective contour closure and continuity. Addressing this issue, this paper introduces a fast, high-fidelity post-processing technique, leveraging domain knowledge about grain boundary connectivity and employing conditional random fields and perceptual grouping rules. This approach significantly enhances segmentation mask accuracy, achieving a 79% segment identification accuracy in validation with a U-Net model on electron microscopy images of a polycrystalline oxide. Additionally, a novel grain alignment metric is introduced, showing a 51% improvement in grain alignment, providing a more detailed assessment of segmentation performance for complex microstructures. This method not only enables rapid and accurate segmentation but also facilitates an unprecedented level of data analysis, significantly improving the statistical representation of grain boundary networks, making it suitable for a range of disciplines where precise segmentation of interconnected line networks is essential.