Characterization of micro pore optics for full-field X-ray fluorescence imaging

Elemental mapping images can be achieved through step scanning imaging using pinhole optics or micro pore optics (MPO), or alternatively by full-field X-ray fluorescence imaging (FF-XRF). X-ray optics for FF-XRF can be manufactured with different micro-channel geometries such as square, hexagonal or circular channels. Each optic geometry creates different imaging artefacts. Square-channel MPOs generate a high intensity central spot due to two reflections via orthogonal channel walls inside a single channel, which is the desirable part for image formation, and two perpendicular lines forming a cross due to reflections in one plane only. Thus, we have studied the performance of a square-channel MPO in an FF-XRF imaging system. The setup consists of a commercially available MPO provided by Photonis and a Timepix3 readout chip with a silicon detector. Imaging of fluorescence from small metal particles has been used to obtain the point spread function (PSF) characteristics. The transmission through MPO channels and variation of the critical reflection angle are characterized by measurements of fluorescence from Copper and Titanium metal fragments. Since the critical angle of reflection is energy dependent, the cross-arm artefacts will affect the resolution differently for different fluorescence energies. It is possible to identify metal fragments due to the form of the PSF function. The PSF function can be further characterized using a Fourier transform to suppress diffuse background signals in the image.

Color Segmentation on FPGA Using Minimum Distance Classifier for Automatic Road Sign Detection

Classification is an important step in machine vision systems; it reveals the true identity of an object using features extracted in pre-processing steps. Practical usage requires the operation to be fast, energy efficient and easy to implement. In this paper, we present a design of the Minimum Distance Classifier based on an FPGA platform. It is optimized by the pipelined structure to strike a balance between device utilization and computational speed. In addition, the dimension of the feature space is modeled as a generic parameter, making it possible for the design to re-generate hardware to cope with feature space with arbitrary dimensions. Its primary application is demonstrated in color segmentation on FPGA in the form of efficient classification using color as a feature. This result is further extended by introducing a multi-class component labeling module to label the segmented color components and measure their geometric properties. The combination of these two modules can effectively detect road signs as the region of interests.